High-Precision Insights with SEM & EDX Analysis

When accuracy matters, our Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray (EDX) analysis services deliver unmatched detail and clarity. These advanced techniques allow us to investigate the surface features and chemical composition of materials at the microscopic level. Whether you're dealing with a component failure, quality control issue, or advanced research project, SEM and EDX provide the critical data needed to make informed decisions. From revealing micro-cracks and corrosion patterns to identifying foreign particles or verifying alloy content, our analysis helps you uncover the truth—right down to the atomic level.

How It Works

SEM uses a focused electron beam to scan the surface of a sample, producing ultra-high-resolution images that reveal texture, structure, and fine features invisible to the naked eye. EDX analysis complements this by detecting the unique X-ray signals emitted by elements in the material when struck by electrons. This enables precise identification of elemental composition—useful for detecting contaminants, verifying materials, or analysing wear patterns. Combined, SEM and EDX offer a powerful diagnostic toolset trusted by industries like aerospace, automotive, energy, and manufacturing to solve complex problems and ensure material integrity.